This bundle was especially designed for single layer thin film measurements, with a light source, a reflection probe and a stage and standard included. The setup can measure thin films ranging from 10 nm up to 50 µm with a resolution of 1 nm and supports UV, VIS and NIR measurements from 200 up to 1100 nm. 

Typical applications:

• Semi-conductor industry
• Solar panels
• Coatings

Downloads